Device Degradation and Resilient Computing
| Author: | P. Glösekötter, U. Greveler, G. I. Wirth |
|---|---|
| Parent Title (English): | IEEE International Symposium on Circuits and Systems |
| Place of publication: | Seattle, USA |
| Document Type: | Part of a Book |
| Language: | English |
| Year of Completion: | 2008 |
| Year of first Publication: | 2008 |
| Release Date: | 2019/01/11 |
| Edition: | May 18-21 |
| Institutes: | Elektrotechnik und Informatik (ETI) |
| Publication list: | Glösekötter, Peter |
| Licence (German): |  Bibliographische Daten |
