Device Degradation and Resilient Computing

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Author:P. Glösekötter, U. Greveler, G. I. Wirth
Parent Title (English):IEEE International Symposium on Circuits and Systems
Place of publication:Seattle, USA
Document Type:Part of a Book
Year of Completion:2008
Year of first Publication:2008
Release Date:2019/01/11
Edition:May 18-21
Faculties:Elektrotechnik und Informatik (ETI)
Publication list:Glösekötter, Peter
Licence (German):License LogoBibliographische Daten