TY  - CHAP
A1  - Glösekötter, P.
A1  - Greveler, U.
A1  - Wirth, G. I.
T1  - Device Degradation and Resilient Computing
T2  - IEEE International Symposium on Circuits and Systems
Y1  - 2008
UR  - https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/8140
CY  - Seattle, USA
ER  -