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Glösekötter, P. (4)
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2008 (4)
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NBTI Degradation and Resilient Circuit Design
(2008)
Glösekötter, P.
;
Berekovic, M.
;
Wirth, G. I.
Modeling the Impact of NBTI on the Reliability of Arithmetic Circuits
(2008)
Camargo, V.
;
da Silva, M.
;
Brusamarello, L.
;
Wirth, G.
;
Glösekötter, P.
Device Degradation and Resilient Computing
(2008)
Glösekötter, P.
;
Greveler, U.
;
Wirth, G. I.
Numerical Method for Modeling Process Variations and NBTI
(2008)
Brusamarello, L.
;
Wirth, G. I.
;
Camargo, V.
;
da Silva, M.
;
da Silva, R.
;
Glösekötter, P.
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4