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Author

  • Glösekötter, P. (4)
  • Wirth, G. I. (4)
  • Agethen, M. (1)
  • Auer, U. (1)
  • Berekovic, M. (1)
  • Brusamarello, L. (1)
  • Camargo, V. (1)
  • Goser, K. F. (1)
  • Greveler, U. (1)
  • Pacha, C. (1)
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Year of publication

  • 2008 (3)
  • 2000 (1)

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  • Part of a Book (4)

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  • English (4)

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  • Elektrotechnik und Informatik (ETI) (4)

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Device Degradation and Resilient Computing (2008)
Glösekötter, P. ; Greveler, U. ; Wirth, G. I.
Numerical Method for Modeling Process Variations and NBTI (2008)
Brusamarello, L. ; Wirth, G. I. ; Camargo, V. ; da Silva, M. ; da Silva, R. ; Glösekötter, P.
NBTI Degradation and Resilient Circuit Design (2008)
Glösekötter, P. ; Berekovic, M. ; Wirth, G. I.
Digital Circuit Design Based on the Resonant-Tunneling-Hetero-Junction-Bipolar-Transistor (2000)
Glösekötter, P. ; Pacha, C. ; Goser, K. F. ; Wirth, G. I. ; Prost, W. ; Auer, U. ; Agethen, M. ; Tegude, F. J.
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