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Numerical Method for Modeling Process Variations and NBTI (2008)

Brusamarello, L. ; Wirth, G. I. ; Camargo, V. ; da Silva, M. ; da Silva, R. ; Glösekötter, P.

Device Degradation and Resilient Computing (2008)

Glösekötter, P. ; Greveler, U. ; Wirth, G. I.

NBTI Degradation and Resilient Circuit Design (2008)

Glösekötter, P. ; Berekovic, M. ; Wirth, G. I.

Digital Circuit Design Based on the Resonant-Tunneling-Hetero-Junction-Bipolar-Transistor (2000)

Glösekötter, P. ; Pacha, C. ; Goser, K. F. ; Wirth, G. I. ; Prost, W. ; Auer, U. ; Agethen, M. ; Tegude, F. J.

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