Analytical features of particle counting sensor based on plasmon assisted microscopy of nano objects
(2011)
The need for portable and on site screening methods for viruses is evident in face of virus infections that can spread lastly in a heavily connected world. A robust and efficient method for detecting viruses is a novel technique called Plasmon Assisted Microscopy of Nanoobjects. It is based on the acquisition of images from a sensor surface exploiting the behavior of surface plasmons in the presence of nanoobjects. In this paper an efficient image analysis approach with respect to the requirements of the sensor is presented and an embedded image processing system for this purpose is introduced. The processing pipeline comprises three steps and starts with restorating the images by removing the background and filtering artifacts. The acquired image series is analyzed pixel by pixel in a second pipeline step in order to detect pixels containing nanoobjects. In a last step pixels are aggregated to nanoobject structures. The paper introduces in the context of this virus detection method a configurable embedded system that was used for rapid prototyping of the image analysis algorithms in a flexible way. (C) 2010 Elsevier B.V. All rights reserved.
The potential use of an EMG-20 mass-spectrometric gas analyzer for process control and safe operation and environmental monitoring in metallurgy (oxygen converter process) is considered. The EMG-20 parameters are adequate for rapid, automatic on-line analysis of metallurgical waste gases. A multichannel system of sampling. sample preparation, and transportation of sampled gases for analysis is proposed.
Silicon microprotrusions with tailored chirality enabled by direct femtosecond laser ablation
(2020)
Here, we report on formation of nanoprotrusions on the surface of a bulk crystalline silicon wafer under femtosecond-laser ablation with a donut-shaped laser beam. By breaking circular symmetry of the irradiating donut-shaped fs-pulse beam, a switch in geometry of the formed surface nanoprotrusions from regular to chiral was demonstrated. The chirality of the obtained Si nanostructures was promoted with an asymmetry degree of the laser beam. An uneven helical flow of laser-melted Si caused by asymmetry of the initial intensity and temperature pattern on the laser-irradiated Si surface explains this phenomenon. Chirality of the formed protrusions was confirmed by visualizing cross-sectional cuts produced by focused ion beam milling as well as Raman activity of these structures probed by circularly polarized light with opposite handedness. Our results open a pathway towards easy-to-implement inexpensive …