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Gaupp, A.
(21)
Mertins, H.-Ch.
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Oppeneer, P. M.
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Jansing, C.
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Abramsohn, D.
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Author
X-ray natural linear dichroism of graphitic materials across the carbon K--edge: correction for perturbing high-order
(2016)
Jansing, C.
;
Mertins, H.-Ch.
;
Gaupp, A.
;
Sokolov, A.
;
Gilbert, M.
;
Wahab, H.
;
Timmers, H.
X-ray natural birefringence in reflection from graphene
(2016)
Jansing, C.
;
Mertins, H.-Ch.
;
Gilbert, M.
;
Wahab, H.
;
Timmers, H.
;
Choi, S.-H.
;
Gaupp, A.
;
Krivenkov, M.
;
Varykhalov, A.
;
Rader, O.
;
Legut, D.
;
Oppeneer, P. M.
X--Ray Kerr Rotation and Ellipticity Spectra at the 2p Edges of Fe, Co and Ni
(2004)
Mertins, H.-Ch.
;
Valencia, S.
;
Abramsohn, D.
;
Gaupp, A.
;
Gudat, W.
;
Oppeneer, P. M.
X--Ray Faraday Effect at the L$_{2,3}$-Edges of Fe, Co and Ni: Theory and Experiment
(2001)
Kunes, J.
;
Oppeneer, P. M.
;
Mertins, H.-Ch.
;
Schäfers, F.
;
Gaupp, A.
;
Gudat, W.
;
Novak, P.
The identification and characterization of carbonaceous interface layers of graphene using polarization--dependent X--ray reflectometry
(2018)
Wahab, H.
;
Jansing, C.
;
Mertins, H.-Ch.
;
Kim, H. J.
;
Choi, S.-H.
;
Gaupp, A.
;
Timmers, H.
Soft-X-ray refractive index by reconciling total-electron-yield with specular reflection: Experimental determination of the optical constants of graphite
(2018)
Jansing, C.
;
Wahab, H.
;
Timmers, H.
;
Gaupp, A.
;
Mertins, H.-Ch.
Soft-X-Ray Magneto-Optical Faraday Effect on Fe and Co Films
(2001)
Mertins, H.-Ch.
;
Schäfers, F.
;
Gaupp, A.
Soft X--Ray Magneto--Optical Constants at the Fe 2p edge determined by Bragg Scattering and Faraday--effect
(2002)
Mertins, H.-Ch.
;
Zaharko, O.
;
Gaupp, A.
;
Schäfers, F.
;
Abramsohn, D.
;
Grimmer, H.
Soft X--Ray Magnetic Dichroism and Farady--Rotation Measured with Linearly Polarised Light
(2001)
Mertins, H.-Ch.
;
Schäfers, F.
;
Gaupp, A.
;
Gudat, W.
;
Kunes, J.
;
Oppeneer, P. M.
Resonant Magnetic Reflection Coefficients measured with Linearly and Circularly Polarized Light
(2002)
Mertins, H.-Ch.
;
Abramsohn, D.
;
Gaupp, A.
;
Schäfers, F.
;
Gudat, W.
;
Zaharko, O.
;
Grimmer, H.
;
Oppeneer, P. M.
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