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Author
Mertins, H.-Ch.
(26)
Timmers, H.
(26)
Jansing, C.
(24)
Wahab, H.
(23)
Gaupp, A.
(21)
Gilbert, M.
(17)
Oppeneer, P. M.
(15)
Legut, D.
(14)
Sokolov, A.
(13)
Krivenkov, M.
(8)
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2016
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Characterisation of self--supporting submicron--thick graphitic carbon foils with polarisation spectroscopy, 38th ANNUAL CONDENSED MATTER AND MATERIALS MEETING Waiheke Island Resort in Auckland, New Zealand 4th - 7th February
(2014)
Timmers, H.
;
Jansing, C.
;
Tesch, M.
;
Gilbert, M.
;
Muirhead, A. G.
;
Gaupp, A.
;
Mertins, H.-Ch.
Investigation of the Natural X--Ray Birefringence of Graphene by Polarization Spectroscopy XAFS 16, Intern. Conference on X--Ray Absorption Fine Structure, Karlsruhe, Germany, 23. -- 28.Sep.
(2015)
Jansing, C.
;
Gilbert, M.
;
Gaupp, A.
;
Mertins, H.-Ch.
;
Tesch, M.
;
Sokolov, A.
;
Choi, Suk-Ho
;
Elliman, R. G.
;
Timmers, H.
;
Legut, D.
;
Oppeneer, P. M.
Reversible rippling of CVD graphene on Copper substrates, 7th International Conference on Recent Progress in Graphene (and Two-dimensional Materials) Research 25-29 Oct., Lorne, Australia
(2015)
Wahab, H.
;
Haverkamp, R.
;
Kim, S.
;
Cadogan, J. M.
;
Mertins, H.-Ch.
;
Choi, S.-H.
;
Timmers, H.
Identification of carbon bonds in graphene oxide using soft x-ray reflectometry\ XAFS 16, Intern. Conference on X--Ray Absorption Fine Structure, Karlsruhe, Germany, 23. -- 28.Sep.
(2015)
Wahab, H.
;
Xu, G.
;
Jansing, C.
;
Gilbert, M.
;
Tesch, M. F.
;
Jin, J.
;
Mertins, H.-Ch.
;
Timmers, H.
Experimental approaches to the determination of the optical constants for graphene in the soft x--ray regime, XAFS 16, Intern. Conference on X--Ray Absorption Fine Structure, Karlsruhe, Germany, 23. -- 28.Sep.
(2015)
Wahab, H.
;
Jansing, C.
;
Timmers, H.
;
Mertins, H.-Ch.
Determination of the refractivew index of graphene across the carbon K-edge 7th International Conference on Recent Progress in Graphene (and Two-dimensional Materials) Research
(2015)
Wahab, H.
;
Jansing, C.
;
Gaupp, A.
;
Timmers, H.
;
Mertins, H.-Ch.
Determination of soft x-ray optical constants of graphene by transmission spectroscopy, Graphene - Week Warsaw, 13. - 17. 2016
(2016)
Jansing, C.
;
Mertins, H.-Ch.
;
Gaupp, A.
;
Gilbert, M.
;
Schümmer, A.
;
Sokolov, A.
;
Rader, O.
;
Varykhalov, A.
;
Krivenkov, M.
;
Wahab, H.
;
Timmers, H.
;
Choi, S.-H.
;
Legut, D.
;
Oppeneer, P. M.
Thickness, roughness and electronic structure characterisation of graphene using soft x-ray reflection spectroscopy DPG Meeting Berlin, O 33.9
(2015)
Jansing, C.
;
Wahab, H.
;
Tesch, M. F.
;
Gilbert, M.
;
Gaupp, A.
;
Mertins, H.-Ch.
;
Sokolov, A.
;
Shin, Dong Hee
;
Choi, Suk-Ho
;
Timmers, H.
;
Legut, D.
;
Oppeneer, P. M.
Soft x-ray characterization of electronic, magnetic and optical properties of graphene\ 18. Intern. Symposium on Physics on Semiconductors and Applications, 3. - 7. 7.2016 Jejuu, Korea
(2016)
Timmers, H.
;
Mertins, H.-Ch.
;
Jansing, C.
;
Wahab, H.
X-ray natural linear dichroism of graphitic materials across the carbon K--edge: correction for perturbing high-order
(2016)
Jansing, C.
;
Mertins, H.-Ch.
;
Gaupp, A.
;
Sokolov, A.
;
Gilbert, M.
;
Wahab, H.
;
Timmers, H.
1
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10