NBTI Degradation and Resilient Circuit Design
| Author: | P. Glösekötter, M. Berekovic, G. I. Wirth |
|---|---|
| Parent Title (English): | Workshop on Impact of Process Variability on Design and Test, held at Design, Automation and Test in Europe Conference |
| Place of publication: | Munich |
| Document Type: | Part of a Book |
| Language: | English |
| Year of Completion: | 2008 |
| Year of first Publication: | 2008 |
| Release Date: | 2019/01/11 |
| Edition: | March 10-14 |
| Faculties: | Elektrotechnik und Informatik (ETI) |
| Publication list: | Glösekötter, Peter |
| Licence (German): |  Bibliographische Daten |