NBTI Degradation and Resilient Circuit Design

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Author:P. Glösekötter, M. Berekovic, G. I. Wirth
Parent Title (English):Workshop on Impact of Process Variability on Design and Test, held at Design, Automation and Test in Europe Conference
Place of publication:Munich
Document Type:Part of a Book
Year of Completion:2008
Year of first Publication:2008
Release Date:2019/01/11
Edition:March 10-14
Faculties:Elektrotechnik und Informatik (ETI)
Publication list:Glösekötter, Peter
Licence (German):License LogoBibliographische Daten