NBTI Degradation and Resilient Circuit Design
Author: | P. Glösekötter, M. Berekovic, G. I. Wirth |
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Parent Title (English): | Workshop on Impact of Process Variability on Design and Test, held at Design, Automation and Test in Europe Conference |
Place of publication: | Munich |
Document Type: | Part of a Book |
Language: | English |
Year of Completion: | 2008 |
Year of first Publication: | 2008 |
Release Date: | 2019/01/11 |
Edition: | March 10-14 |
Institutes: | Elektrotechnik und Informatik (ETI) |
Publication list: | Glösekötter, Peter |
Licence (German): | ![]() |