Modeling the Impact of NBTI on the Reliability of Arithmetic Circuits

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Author:V. Camargo, M. da Silva, L. Brusamarello, G. Wirth, P. Glösekötter
Parent Title (English):Chip In The Pampa SBCCI
Document Type:Part of a Book
Year of Completion:2008
Year of first Publication:2008
Release Date:2019/01/11
Edition:September 1-4, SFORU
Faculties:Elektrotechnik und Informatik (ETI)
Publication list:Glösekötter, Peter
Licence (German):License LogoBibliographische Daten