Conversion Efficiency of Radiation Damage Profiles into Hydrogen-Related Donor Profiles
| Author: | G. Johannes, Reinhart Laven, W. Job, H.-J. Schustereder, F.- J. Schulze, H. Niedernostheide, L. Schulze |
|---|---|
| Parent Title (English): | W. Jantsch, F. Schäfer (Editors): Gettering and Defect Engineering in Semiconductor Technology XIV (GADEST 2011) |
| Publisher: | Trans Tech Publications Ltd. |
| Place of publication: | Zürich |
| Document Type: | Part of a Book |
| Language: | English |
| Year of Completion: | 2011 |
| Year of first Publication: | 2011 |
| Release Date: | 2019/01/11 |
| Edition: | 1 |
| First Page: | 375 |
| Last Page: | 384 |
| Institutes: | Elektrotechnik und Informatik (ETI) |
| Publication list: | Job, Reinhart |
| Licence (German): |  Bibliographische Daten |
