TY  - CHAP
A1  - Johannes, G.
A1  - Laven, Reinhart
A1  - Job, W.
A1  - Schustereder, H.-J.
A1  - Schulze, F.- J.
A1  - Niedernostheide, H.
A1  - Schulze, L.
T1  - Conversion Efficiency of Radiation Damage Profiles into Hydrogen-Related Donor Profiles
T2  - W. Jantsch, F. Schäfer (Editors): Gettering and Defect Engineering in Semiconductor Technology XIV (GADEST 2011)
Y1  - 2011
UR  - https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/4696
SP  - 375
EP  - 384
PB  - Trans Tech Publications Ltd.
CY  - Zürich
ER  -