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  • Gerke, Sebastian (1) (remove)

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  • 2013 (1)

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Evaluation of Capacitance-Voltage Spectroscopy by Correlation with Minority Carrier Lifetime Measurements of PECV-Deposited Intrinsic Amorphous Layers (2013)
Gerke, Sebastian ; Herguth, Axel ; Brinkmann, Nils ; Hahn, Giso ; Job, Reinhart
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