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Deep-Level Defects in High-Dose Proton Implanted and High-Temperature Annealed Silicon
(2014)
Jelinek, Moriz
;
Johannes, G.
;
Laven, Mathias
;
Rommel, Werner
;
Schustereder, Hans-Joachim
;
Schulze, Lother
;
Frey, Reinhart
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