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Oppeneer, P. M. (5)
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2015 (5)
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Thickness, roughness and electronic structure characterisation of graphene using soft x-ray reflection spectroscopy DPG Meeting Berlin, O 33.9
(2015)
Jansing, C.
;
Wahab, H.
;
Tesch, M. F.
;
Gilbert, M.
;
Gaupp, A.
;
Mertins, H.-Ch.
;
Sokolov, A.
;
Shin, Dong Hee
;
Choi, Suk-Ho
;
Timmers, H.
;
Legut, D.
;
Oppeneer, P. M.
Ab initio calculation of XNLD in reflection of graphene\ DPG Meeting Berlin, O87.13
(2015)
Legut, D.
;
Oppeneer, P. M.
;
Jansing, C.
;
Tesch, M. F.
;
Gilbert, M.
;
Gaupp, A.
;
Mertins, H.-Ch.
;
Sokolov, A.
;
Choi, Suk-Ho
;
Wahab, H.
;
Timmers, H.
;
Elliman, R. G.
Investigation of the Natural X--Ray Birefringence of Graphene by Polarization Spectroscopy XAFS 16, Intern. Conference on X--Ray Absorption Fine Structure, Karlsruhe, Germany, 23. -- 28.Sep.
(2015)
Jansing, C.
;
Gilbert, M.
;
Gaupp, A.
;
Mertins, H.-Ch.
;
Tesch, M.
;
Sokolov, A.
;
Choi, Suk-Ho
;
Elliman, R. G.
;
Timmers, H.
;
Legut, D.
;
Oppeneer, P. M.
Observation of Natural X-Ray Birefringence of Graphene, DPG Meeting Berlin, O 28.6
(2015)
Jansing, C.
;
Tesch, M. F.
;
Gilbert, M.
;
Gaupp, A.
;
Mertins, H.-Ch.
;
Sokolov, A.
;
Shin, Dong Hee
;
Choi, Suk-Ho
;
Timmers, H.
;
Legut, D.
;
Oppeneer, P. M.
Interference Effects on T--MOKE in Reflection of Fe Thin Films at the 3p Edges--Theory and Experiment
(2015)
Legut, D.
;
Tesch, M.
;
Mertins, H.-Ch.
;
Jansing, C.
;
Gilbert, M.
;
Gaupp, A.
;
Oppeneer, P. M.
;
B"urgler, D.
;
Schneide, C.
1
to
5