Defect Engineering and Analysis of Light-Ion Implanted Float-Zone Silicon, Seminar, 4.9.2012, Engineering School, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brasilien
Author: | Reinhart Job |
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Document Type: | Lecture |
Language: | English |
Year of Completion: | 2012 |
Year of first Publication: | 2012 |
Release Date: | 2019/01/11 |
Faculties: | Elektrotechnik und Informatik (ETI) |
Publication list: | Job, Reinhart |
Licence (German): | Bibliographische Daten |