Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
| Author: | Sebastian Gerke, Gabriel Micard, Reinhart Job, Giso Hahn, Barbara Terheiden |
|---|---|
| DOI: | https://doi.org/10.1002/pssc.201600019 |
| Parent Title (English): | Physica Status Solidi (c) |
| Document Type: | Article |
| Language: | English |
| Year of Completion: | 2016 |
| Year of first Publication: | 2016 |
| Release Date: | 2019/01/11 |
| First Page: | 1 |
| Last Page: | 5 |
| Institutes: | Elektrotechnik und Informatik (ETI) |
| Publication list: | Job, Reinhart |
| Licence (German): |  Bibliographische Daten |
