Thickness, roughness and electronic structure characterisation of graphene using soft x-ray reflection spectroscopy DPG Meeting Berlin, O 33.9
C. Jansing, H. Wahab, M. F. Tesch, M. Gilbert, A. Gaupp, H.-Ch. Mertins, A. Sokolov, Dong Hee Shin, Suk-Ho Choi, H. Timmers, D. Legut, P. M. Oppeneer
Metadaten| Author: | C. Jansing, H. Wahab, M. F. Tesch, M. Gilbert, A. Gaupp, H.-Ch. Mertins, A. Sokolov, Dong Hee Shin, Suk-Ho Choi, H. Timmers, D. Legut, P. M. Oppeneer |
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| Document Type: | Lecture |
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| Language: | English |
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| Year of Completion: | 2015 |
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| Year of first Publication: | 2015 |
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| Release Date: | 2019/01/11 |
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| Faculties: | Physikingenieurwesen (PHY) |
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| Publication list: | Mertins, Hans-Christoph |
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| Licence (German): |  Bibliographische Daten |
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