Defect Engineering and Analysis of Light-Ion Implanted Float-Zone Silicon, Seminar, 4.9.2012, Engineering School, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brasilien

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Author:Reinhart Job
Document Type:Lecture
Language:English
Year of Completion:2012
Year of first Publication:2012
Release Date:2019/01/11
Faculties:Elektrotechnik und Informatik (ETI)
Publication list:Job, Reinhart
Licence (German):License LogoBibliographische Daten