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Author
Gerke, Sebastian
(8)
Hahn, Giso
(7)
Job, Reinhart
(7)
Terheiden, Barbara
(7)
Becker, Hans-Werner
(4)
Rogalla, Detlef
(4)
Becker, H.-W.
(1)
Brinkmann, N.
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Flege, S.
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2015
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Influence of post hydrogenation upon electrical, optical and structural properties of hydrogen less sputter deposited amorphous silicon
(2016)
Gerke, Sebastian
;
Becker, H.-W.
;
Rogalla, D.
;
Singer, F.
;
Brinkmann, N.
;
Fritz, S
;
Hammud, Adnan
;
Keller, P.
;
Skorka, D.
;
Sommer, D.
;
Weiß, C.
;
Flege, S.
;
Hahn, Giso
;
Job, Reinhard
;
Terheiden, Barbara
Morphology and Hydrogen in Passivating Amorphous Silicon Layers
(2015)
Gerke, Sebastian
;
Becker, Hans-Werner
;
Rogalla, Detlef
;
Hahn, Giso
;
Job, Reinhart
;
Terheiden, Barbara
Model based prediction of the trap limited diffusion of hydrogen in post-hydrogenated amorphous silicon
(2016)
Gerke, Sebastian
;
Becker, Hans-Werner
;
Rogalla, Detlef
;
Job, Reinhart
;
Terheiden, Barbara
Evaluation of Capacitance-Voltage Spectroscopy by Correlation with Minority Carrier Lifetime Measurements of PECV-Deposited Intrinsic Amorphous Layers
(2013)
Gerke, Sebastian
;
Herguth, Axel
;
Brinkmann, Nils
;
Hahn, Giso
;
Job, Reinhart
Investigation of Hydrogen Dependent Long-Time Thermal Characteristics of PECV-Deposited Intrinsic Amorphous Layers of Different Morphologies
(2014)
Gerke, Sebastian
;
Becker, Hans-Werner
;
Rogalla, Detlef
;
Hahn, Giso
;
Job, Reinhart
;
Terheiden, Barbara
Bias-plasma for RF magnetron sputter deposition of passivating amorphous silicon layers
(2015)
Gerke, Sebastian
;
Hahn, Giso
;
Job, Reinhart
;
Terheiden, Barbara
About Nuclear Resonant Reaction Analysis for Hydrogen Investigations in Amorphous Silicon Layers
(2015)
Gerke, Sebastian
;
Becker, Hans-Werner
;
Rogalla, Detlef
;
Hahn, Giso
;
Job, Reinhart
;
Terheiden, Barbara
Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
(2016)
Gerke, Sebastian
;
Micard, Gabriel
;
Job, Reinhart
;
Hahn, Giso
;
Terheiden, Barbara
1
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8