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Evaluation of Capacitance-Voltage Spectroscopy by Correlation with Minority Carrier Lifetime Measurements of PECV-Deposited Intrinsic Amorphous Layers (2013)

Gerke, Sebastian ; Herguth, Axel ; Brinkmann, Nils ; Hahn, Giso ; Job, Reinhart

Investigation of Hydrogen Dependent Long-Time Thermal Characteristics of PECV-Deposited Intrinsic Amorphous Layers of Different Morphologies (2014)

Gerke, Sebastian ; Becker, Hans-Werner ; Rogalla, Detlef ; Hahn, Giso ; Job, Reinhart ; Terheiden, Barbara

Morphology and Hydrogen in Passivating Amorphous Silicon Layers (2015)

Gerke, Sebastian ; Becker, Hans-Werner ; Rogalla, Detlef ; Hahn, Giso ; Job, Reinhart ; Terheiden, Barbara

Bias-plasma for RF magnetron sputter deposition of passivating amorphous silicon layers (2015)

Gerke, Sebastian ; Hahn, Giso ; Job, Reinhart ; Terheiden, Barbara

About Nuclear Resonant Reaction Analysis for Hydrogen Investigations in Amorphous Silicon Layers (2015)

Gerke, Sebastian ; Becker, Hans-Werner ; Rogalla, Detlef ; Hahn, Giso ; Job, Reinhart ; Terheiden, Barbara

Influence of post hydrogenation upon electrical, optical and structural properties of hydrogen less sputter deposited amorphous silicon (2016)

Gerke, Sebastian ; Becker, H.-W. ; Rogalla, D. ; Singer, F. ; Brinkmann, N. ; Fritz, S ; Hammud, Adnan ; Keller, P. ; Skorka, D. ; Sommer, D. ; Weiß, C. ; Flege, S. ; Hahn, Giso ; Job, Reinhard ; Terheiden, Barbara

Model based prediction of the trap limited diffusion of hydrogen in post-hydrogenated amorphous silicon (2016)

Gerke, Sebastian ; Becker, Hans-Werner ; Rogalla, Detlef ; Job, Reinhart ; Terheiden, Barbara

Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films (2016)

Gerke, Sebastian ; Micard, Gabriel ; Job, Reinhart ; Hahn, Giso ; Terheiden, Barbara

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