Soft X-ray magnetic reflection spectroscopy at the 3p absorption edges of thin Fe films
Author: | M. Hecker, P. M. Oppeneer, S. Valencia, H.-Ch. Mertins, C. M. Schneider |
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Parent Title (English): | Journal of Electron Spectroscopy and Related Phenomena |
Document Type: | Article |
Language: | English |
Year of Completion: | 2005 |
Year of first Publication: | 2005 |
Release Date: | 2019/01/11 |
Volume: | 144 - 147 |
First Page: | 881 |
Last Page: | 884 |
Faculties: | Physikingenieurwesen (PHY) |
Publication list: | Mertins, Hans-Christoph |
Licence (German): | Bibliographische Daten |