Soft-X-ray refractive index by reconciling total-electron-yield with specular reflection: Experimental determination of the optical constants of graphite
| Author: | C. Jansing, H. Wahab, H. Timmers, A. Gaupp, H.-Ch. Mertins |
|---|---|
| DOI: | https://doi.org/10.1107/S1600577518010408 |
| Parent Title (English): | J. Synchr. Rad. |
| Document Type: | Article |
| Language: | English |
| Year of Completion: | 2018 |
| Year of first Publication: | 2018 |
| Release Date: | 2019/01/11 |
| Volume: | 25 |
| First Page: | 1433 |
| Last Page: | 1443 |
| Faculties: | Physikingenieurwesen (PHY) |
| Publication list: | Mertins, Hans-Christoph |
| Licence (German): |  Bibliographische Daten |