The identification and characterization of carbonaceous interface layers of graphene using polarization--dependent X--ray reflectometry
| Author: | H. Wahab, C. Jansing, H.-Ch. Mertins, H. J. Kim, S.-H. Choi, A. Gaupp, H. Timmers |
|---|---|
| DOI: | https://doi.org/10.1016/j.carbon.2018.05.021 |
| Parent Title (English): | Carbon |
| Document Type: | Article |
| Language: | English |
| Year of Completion: | 2018 |
| Year of first Publication: | 2018 |
| Release Date: | 2019/01/11 |
| Volume: | 137 |
| First Page: | 252 |
| Last Page: | 265 |
| Faculties: | Physikingenieurwesen (PHY) |
| Publication list: | Mertins, Hans-Christoph |
| Licence (German): |  Bibliographische Daten |