Effective Pattern Representation for Safety Critical Embedded Systems
Author: | A. Armoush, F. Salewski, S. Kowalewski |
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DOI: | https://doi.org/10.1109/CSSE.2008.739 |
Parent Title (English): | Proc. 2008 International Conference on Computer Science and Software Engineering, vol. 4 |
Publisher: | IEEE CS |
Document Type: | Part of a Book |
Language: | English |
Year of Completion: | 2008 |
Year of first Publication: | 2008 |
Release Date: | 2019/01/11 |
First Page: | 91 |
Last Page: | 97 |
Faculties: | Elektrotechnik und Informatik (ETI) |
Publication list: | Salewski, Falk |
Licence (German): | Bibliographische Daten |