Design Pattern Representation for Safety-Critical Embedded Systems

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Author:A. Armoush, F. Salewski, S. Kowalewski
DOI:https://doi.org/10.4236/jsea.2009.21001
Parent Title (English):Journal of Software Engineering and Applications (JSEA)
Document Type:Article
Language:English
Year of Completion:2009
Year of first Publication:2009
Release Date:2019/01/11
Volume:2
Issue:1
First Page:1
Last Page:12
Faculties:Elektrotechnik und Informatik (ETI)
Publication list:Salewski, Falk
Licence (German):License LogoBibliographische Daten