Effective Pattern Representation for Safety Critical Embedded Systems
| Author: | A. Armoush, F. Salewski, S. Kowalewski |
|---|---|
| DOI: | https://doi.org/10.1109/CSSE.2008.739 |
| Parent Title (English): | Proc. 2008 International Conference on Computer Science and Software Engineering, vol. 4 |
| Publisher: | IEEE CS |
| Document Type: | Part of a Book |
| Language: | English |
| Year of Completion: | 2008 |
| Year of first Publication: | 2008 |
| Release Date: | 2019/01/11 |
| First Page: | 91 |
| Last Page: | 97 |
| Faculties: | Elektrotechnik und Informatik (ETI) |
| Publication list: | Salewski, Falk |
| Licence (German): |  Bibliographische Daten |