TY - CHAP A1 - Salewski, Falk A1 - Schmidt, Rainer T1 - Teaching Industrial Automation: An Approach for a Practical Lab Course T2 - Proc. of the Workshop on Embedded and Cyber-Physical Systems Education (WESE 2015) Y1 - 2015 SN - 978-1-4503-3897-4 U6 - http://dx.doi.org/10.1145/2832920.2832921 SP - 1 EP - 7 PB - ACM CY -  Amsterdam, Netherlands ER - TY - BOOK A1 - Poppe, Martin T1 - Prüfungstrainer Elektrotechnik Y1 - 2018 SN - 9783662566480 U6 - http://dx.doi.org/10.1007/978-3-662-56649-7 PB - Springer CY - Heidelberg ET - 3 ER - TY - JOUR A1 - Poppe, Martin T1 - Exclusive Hadron Production in Two-Photon Reactions JF - International Journal of Modern Physics A Y1 - 1986 U6 - http://dx.doi.org/10.1142/S0217751X8600023X VL - 1 IS - 3 SP - 545 EP - 668 ER - TY - JOUR A1 - Mertens, K. A1 - Stegemann, Th. A1 - Stöppel, T. T1 - Mit günstiger Alternative EL-Bilder erstellen JF - Elektropraktiker Photovoltaik Y1 - 2012 IS - 7/8 SP - 44 EP - 45 ER - TY - CHAP A1 - Kirnstötter, Stefan A1 - Faccinelli, Martin A1 - Hadley, Peter A1 - Job, Reinhart A1 - Schustereder, Werner A1 - Johannes, G. A1 - Laven, Hans-Joachim T1 - Imaging Superjunctions in CoolMOS™ Devices using Electron Beam Induced Current T2 - G. Wirth, N. Morimoto, D. Vasileska (Editors): Microelectronics Technology and Devices - SBMicro 2012, ECS Transactions 49(1) Y1 - 2012 SP - 475 EP - 481 ER - TY - CHAP A1 - Beckschulze, E. A1 - Salewski, F. A1 - Siegbert, T. A1 - Kowalewski, S. T1 - Fault Handling Approaches on Dual-Core Microcontrollers in Safety-Critical Automotive Applications T2 - Proc. Leveraging Applications of Formal Methods, Verification and Validation (ISoLA08), 2009, vol. 17 in Communications in Computer and Information Science Y1 - 2009 U6 - http://dx.doi.org/10.1007/978-3-540-88479-8_7 SP - 82 EP - 92 PB - Springer CY - Berlin, Heidelberg ER - TY - CHAP A1 - Salewski, F. A1 - Kowalewski, S. T1 - Hardware Platform Design Decisions In Embedded Systems - A Systematic Teaching Approach T2 - Proc. Special Issue on the Second Workshop on Embedded System Education (WESE 06), 2007, vol. 4 Y1 - 2007 SP - 27 EP - 35 PB - ACM ER - TY - CHAP A1 - Schlich, B. A1 - Salewski, F. A1 - Kowalewski, S. T1 - Applying Model Checking to an Automotive Microcontroller Application T2 - Proc. Industrial Embedded Systems (SIES 07), Lisbon, Portugal Y1 - 2007 U6 - http://dx.doi.org/10.1109/SIES.2007.4297337 SP - 209 EP - 216 PB - IEEE Computer Society Press ER - TY - CHAP A1 - Gonzalez, Jesús A1 - Penalver, Miguel T1 - Vi Edición De Las Jornadas De Computacion Empotrada (JCE 2015) Y1 - 2015 SN - 978-84-16017-54-6 PB - Pedro del Río Obejo (Copisterías Don Folio) ER - TY - CHAP A1 - Aviram, Nimrod A1 - Schinzel, Sebastian A1 - Somorovsky, Juraj A1 - Heninger, Nadia A1 - Dankel, Maik A1 - Steube, Jens A1 - Valenta, Luke A1 - Adrian, David A1 - Halderman, J. Alex A1 - Dukhovni, Viktor A1 - Käsper, Emilia A1 - Cohney, Shaanan A1 - Engels, Susanne A1 - Paar, Christof A1 - Shavitt, Yuval T1 - DROWN: Breaking TLS Using SSLv2 T2 - 25th Usenix Security Symposium Y1 - 2016 SP - 689 EP - 706 PB - Usenix Association. CY - Austin, TX. ER -