TY  - JOUR
A1  - Johannes, G.
A1  - Laven, Reinhart
A1  - Job, Werner
A1  - Schustereder, Hans-Joachim
A1  - Schulze, Franz-Josef
A1  - Niedernostheide, Holger
A1  - Schulze, Lothar
T1  - Conversion Efficiency of Radiation Damage Profiles into Hydrogen-Related Donor Profiles
JF  - Solid State Phenomena
Y1  - 2011
VL  - 178-179
SP  - 375
EP  - 384
ER  - 
TY  - CHAP
A1  - Jelinek, Moriz
A1  - Johannes, G.
A1  - Laven, Mathias
A1  - Rommel, Werner
A1  - Schustereder, Hans-Joachim
A1  - Schulze, Lother
A1  - Frey, Reinhart
T1  - Deep-Level Defects in High-Dose Proton Implanted and High-Temperature Annealed Silicon
T2  - E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazuré (Editors): High Purity Silicon XIII, ECS Transactions <u>64</u>(11)
Y1  - 2014
SP  - 173
EP  - 185
ER  - 
TY  - CHAP
A1  - Jelinek, Moriz
A1  - Johannes, G.
A1  - Laven, Reinhart
A1  - Job, Werner
A1  - Schustereder, Hans-Joachim
A1  - Schulze, Mathias
A1  - Rommel, Lothar
T1  - A New Method to Increase the Doping Efficiency of Proton Implantation in a High-Dose Regime
T2  - E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazuré (Editors): High Purity Silicon XIII, ECS Transactions 64(11)
Y1  - 2014
SP  - 199
EP  - 208
ER  -