TY  - CHAP
A1  - Brusamarello, L.
A1  - Wirth, G. I.
A1  - Camargo, V.
A1  - da Silva, M.
A1  - da Silva, R.
A1  - Glösekötter, P.
T1  - Numerical Method for Modeling Process Variations and NBTI
T2  - 16th IFIP/IEEE VLSI-SOC
Y1  - 2008
CY  - Rhodes Island, Greece
ET  - Oct. 13-15
ER  - 
TY  - CHAP
A1  - Glösekötter, P.
A1  - Greveler, U.
A1  - Wirth, G. I.
T1  - Device Degradation and Resilient Computing
T2  - IEEE International Symposium on Circuits and Systems
Y1  - 2008
CY  - Seattle, USA
ET  - May 18-21
ER  - 
TY  - CHAP
A1  - Glösekötter, P.
A1  - Berekovic, M.
A1  - Wirth, G. I.
T1  - NBTI Degradation and Resilient Circuit Design
T2  - Workshop on Impact of Process Variability on Design and Test,  held at Design, Automation and Test in Europe Conference
Y1  - 2008
CY  - Munich
ET  - March 10-14
ER  - 
TY  - CHAP
A1  - Glösekötter, P.
A1  - Pacha, C.
A1  - Goser, K. F.
A1  - Wirth, G. I.
A1  - Prost, W.
A1  - Auer, U.
A1  - Agethen, M.
A1  - Tegude, F. J.
T1  - Digital Circuit Design Based on the Resonant-Tunneling-Hetero-Junction-Bipolar-Transistor
T2  - SBCCI
Y1  - 2000
CY  - Manaus, Brasil
ET  - Sept. 18-24
ER  -