TY  - CHAP
A1  - Krimphove, C.
A1  - Hoffmann, F.
A1  - Rebel, G.
A1  - Glösekötter, P.
T1  - Wearout-Free Oxygen Sensor (published and awarded with the Bronze Leaf Certificate)
T2  - 8th Conference on Ph.D. Research in Microelectronics & Electronics
Y1  - 2012
SN  - 978-3-8007-3442-9
CY  - Aachen, Germany
ET  - 12 - 15 Juni 2012
ER  - 
TY  - CHAP
A1  - Torres, C.
A1  - Olivares, A.
A1  - Pomares, H.
A1  - Rojas, I.
A1  - Olivares, G.
A1  - Glösekötter, P.
T1  - Reliable and Energy Optimized Routing Algorithm for WSN
T2  - RFID-Sys-Tech 2010, European Workshop on Smart Objects: Systems, Technologies and Applications
Y1  - 2010
CY  - Ciudad Real, Spain
ET  - June 15th to June 16
ER  - 
TY  - CHAP
A1  - Olivares, A.
A1  - Górriz, J. M.
A1  - Olivares, G.
A1  - Ramírez, J.
A1  - Glösekötter, P.
T1  - A Study of Vibration-Based Energy Harvesting in Activities of Daily Living
T2  - 4th International ICST Conference on Pervasive Computing Technologies for Healthcare
Y1  - 2010
CY  - Munich, Germany
ET  - March
ER  - 
TY  - CHAP
A1  - Rubio, G.
A1  - Guillén, A.
A1  - Pomares, H.
A1  - Rojas, I.
A1  - Paechter, B.
A1  - Glösekötter, P.
A1  - Torres-Ceballos, C. I.
T1  - Parallelization of the Nearest-Neighbour Search and the Cross-Validation Error Evaluation  for the Kernel Weighted k-nn Algorithm Applied to Large Data Sets in Matlab
T2  - High Performance Computing & Simulation (HPCS'09) Conference
Y1  - 2009
CY  - Leipzig, Germany
ET  - June
ER  - 
TY  - CHAP
A1  - Brusamarello, L.
A1  - Wirth, G. I.
A1  - Camargo, V.
A1  - da Silva, M.
A1  - da Silva, R.
A1  - Glösekötter, P.
T1  - Numerical Method for Modeling Process Variations and NBTI
T2  - 16th IFIP/IEEE VLSI-SOC
Y1  - 2008
CY  - Rhodes Island, Greece
ET  - Oct. 13-15
ER  - 
TY  - CHAP
A1  - Camargo, V.
A1  - da Silva, M.
A1  - Brusamarello, L.
A1  - Wirth, G.
A1  - Glösekötter, P.
T1  - Modeling the Impact of NBTI on the Reliability of Arithmetic Circuits
T2  - Chip In The Pampa SBCCI
Y1  - 2008
ET  - September 1-4, SFORU
ER  - 
TY  - CHAP
A1  - Glösekötter, P.
A1  - Greveler, U.
A1  - Wirth, G. I.
T1  - Device Degradation and Resilient Computing
T2  - IEEE International Symposium on Circuits and Systems
Y1  - 2008
CY  - Seattle, USA
ET  - May 18-21
ER  - 
TY  - CHAP
A1  - Glösekötter, P.
A1  - Berekovic, M.
A1  - Wirth, G. I.
T1  - NBTI Degradation and Resilient Circuit Design
T2  - Workshop on Impact of Process Variability on Design and Test,  held at Design, Automation and Test in Europe Conference
Y1  - 2008
CY  - Munich
ET  - March 10-14
ER  - 
TY  - CHAP
A1  - Goser, K.
A1  - Glösekötter, P.
A1  - Dienstuhl, J.
T1  - Nanoelectronics and Nanosystems - From Transistors to Molecular and Quantum Devices
Y1  - 2004
SN  - 3-540-40443-0
PB  - Springer
CY  - Berlin, Heidelberg, New York
ER  - 
TY  - CHAP
A1  - Glösekötter, P.
A1  - Prost, W.
A1  - Pacha, C.
A1  - Kim, S. O.
A1  - van Husen, H.
A1  - Reimann, T.
A1  - Tegude, F.- J.
A1  - Goser, K. F.
T1  - Pseudo Dynamic Gate Design based on the Resonant-Tunneling-Bipolar-Transistor (RTBT)
T2  - 32nd European Solid-State Device Research Conference (ESSDERC)
Y1  - 2002
CY  - Florence, Italy
ET  - Sept. 24-26
ER  -