TY  - CHAP
A1  - Jelinek, Moriz
A1  - Johannes, G.
A1  - Laven, Naveen
A1  - Ganagona, Goud
A1  - Job, Reinhart
A1  - Schustereder, Werner
A1  - Schulze, Hans-Joachim
A1  - Rommel, Matthias
A1  - Frey, Lothar
T1  - Metastable Defects in Proton Implanted and Annealed Silicon
T2  - P. Pichler (Editor): Gettering and Defect Engineering in Semiconductor Technology XVI (GADEST 2015)
Y1  - 2016
SN  - 978-3-03835-608-0
SP  - 169
EP  - 174
PB  - Trans Tech Publications Ltd.
CY  - Zürich
ER  - 
TY  - JOUR
A1  - Johannes, G.
A1  - Laven, Moriz
A1  - Jelinek, Reinhart
A1  - Job, Hans-Joachim
A1  - Schulze, Werner
A1  - Schustereder, Stefan
A1  - Kirnstötter, Mathias
A1  - Rommel, Lothar
T1  - DLTS Characterization of Proton Implanted Silicon under Varying Annealing Conditions
JF  - Physica Status Solidi (b)
Y1  - 2014
VL  - 251
IS  - 11
SP  - 2189
EP  - 2192
ER  - 
TY  - CHAP
A1  - Jelinek, Moriz
A1  - Johannes, G.
A1  - Laven, Mathias
A1  - Rommel, Werner
A1  - Schustereder, Hans-Joachim
A1  - Schulze, Lother
A1  - Frey, Reinhart
T1  - Deep-Level Defects in High-Dose Proton Implanted and High-Temperature Annealed Silicon
T2  - E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazuré (Editors): High Purity Silicon XIII, ECS Transactions <u>64</u>(11)
Y1  - 2014
SP  - 173
EP  - 185
ER  - 
TY  - CHAP
A1  - Jelinek, Moriz
A1  - Johannes, G.
A1  - Laven, Reinhart
A1  - Job, Werner
A1  - Schustereder, Hans-Joachim
A1  - Schulze, Mathias
A1  - Rommel, Lothar
T1  - A New Method to Increase the Doping Efficiency of Proton Implantation in a High-Dose Regime
T2  - E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazuré (Editors): High Purity Silicon XIII, ECS Transactions 64(11)
Y1  - 2014
SP  - 199
EP  - 208
ER  - 
TY  - JOUR
A1  - Johannes, G.
A1  - Laven, Reinhart
A1  - Job, Hans
A1  - Schulze, -Joachim
A1  - Niedernostheide, Franz-Josef
A1  - Schustereder, Werner
A1  - Frey, Lothar
T1  - Activation and Dissociation of Proton-Induced Donor Profiles in Silicon
JF  - ECS Journal of Solid State Science and Technology
Y1  - 2013
VL  - 2
IS  - 9
SP  - 389
EP  - 394
ER  - 
TY  - JOUR
A1  - Job, Reinhart
A1  - Johannes, G.
A1  - Laven, Franz-Josef
A1  - Niedernostheide, Hans-Joachim
A1  - Schulze, Holger
A1  - Schulze, Werner
T1  - Defect Engineering for Modern Power Devices
JF  - Physica Status Solidi (a)
Y1  - 2012
VL  - 209
SP  - 1940
EP  - 1949
ER  - 
TY  - CHAP
A1  - Johannes, G.
A1  - Laven, Reinhart
A1  - Job, Hans-Joachim
A1  - Schulze, Franz-Josef
A1  - Niedernostheide, Werner
A1  - Schustereder, Lothar
T1  - The Thermal Budget of Hydrogen-related Donor Profiles: Diffusion-limited Activation and Thermal Dissociation
T2  - E. Simoen, C. L. Claeys, P. Stallhofer, R. Falster, C. Mazuré (Editors): High Purity Silicon 12, ECS Transactions <u>50</u>(5)
Y1  - 2012
SP  - 161
EP  - 175
ER  - 
TY  - CHAP
A1  - Kirnstötter, Stefan
A1  - Faccinelli, Martin
A1  - Hadley, Peter
A1  - Job, Reinhart
A1  - Schustereder, Werner
A1  - Johannes, G.
A1  - Laven, Hans-Joachim
T1  - Investigation of Doping Type Conversion and Diffusion Length Extraction of Proton Implanted Silicon by EBIC
T2  - E. Simoen, C. L. Claeys, P. Stallhofer, R. Falster, C. Mazuré (Editors): High Purity Silicon 12, ECS Transactions <u>50</u>(5)
Y1  - 2012
SP  - 115
EP  - 120
ER  - 
TY  - CHAP
A1  - Kirnstötter, Stefan
A1  - Faccinelli, Martin
A1  - Hadley, Peter
A1  - Job, Reinhart
A1  - Schustereder, Werner
A1  - Johannes, G.
A1  - Laven, Hans-Joachim
T1  - Imaging Superjunctions in CoolMOS&#8482; Devices using Electron Beam Induced Current
T2  - G. Wirth, N. Morimoto, D. Vasileska (Editors): Microelectronics Technology and Devices - SBMicro 2012, ECS Transactions <u>49</u>(1)
Y1  - 2012
SP  - 475
EP  - 481
ER  - 
TY  - CHAP
A1  - Johannes, G.
A1  - Laven, Reinhart
A1  - Job, W.
A1  - Schustereder, H.-J.
A1  - Schulze, F.- J.
A1  - Niedernostheide, H.
A1  - Schulze, L.
T1  - Conversion Efficiency of Radiation Damage Profiles into Hydrogen-Related Donor Profiles
T2  - W. Jantsch, F. Schäfer (Editors): Gettering and Defect Engineering in Semiconductor Technology XIV (GADEST 2011)
Y1  - 2011
SP  - 375
EP  - 384
PB  - Trans Tech Publications Ltd.
CY  - Zürich
ET  - 1
ER  - 
TY  - JOUR
A1  - Johannes, G.
A1  - Laven, Reinhart
A1  - Job, Werner
A1  - Schustereder, Hans-Joachim
A1  - Schulze, Franz-Josef
A1  - Niedernostheide, Holger
A1  - Schulze, Lothar
T1  - Conversion Efficiency of Radiation Damage Profiles into Hydrogen-Related Donor Profiles
JF  - Solid State Phenomena
Y1  - 2011
VL  - 178-179
SP  - 375
EP  - 384
ER  -