TY  - CHAP
A1  - Armoush, A.
A1  - Salewski, F.
A1  - Kowalewski, S.
T1  - A Hybrid Fault Tolerance Method for Recovery Block with a Weak Acceptance Test
T2  - Proc. The 5th IEEE/IFIP International Conference on Embedded and Ubiquitous Computing (EUC 2008),  vol. 1
Y1  - 2008
U6  - http://dx.doi.org/10.1109/EUC.2008.102
SP  - 484
EP  - 491
PB  - IEEE CS
ER  - 
TY  - CHAP
A1  - Armoush, A.
A1  - Salewski, F.
A1  - Kowalewski, S.
T1  - Effective Pattern Representation for Safety Critical Embedded Systems
T2  - Proc. 2008 International Conference on Computer Science and Software Engineering,  vol. 4
Y1  - 2008
U6  - http://dx.doi.org/10.1109/CSSE.2008.739
SP  - 91
EP  - 97
PB  - IEEE CS
ER  - 
TY  - CHAP
A1  - Armoush, A.
A1  - Salewski, F.
A1  - Kowalewski, S.
T1  - Recovery Block with Backup Voting: A New Pattern with Extended Representation for Safety Critical Embedded Systems
T2  - Proc. 11th International Conference on Information Technology (ICIT 2008)
Y1  - 2008
U6  - http://dx.doi.org/10.1109/ICIT.2008.60
SP  - 232
EP  - 237
PB  - IEEE CS
ER  - 
TY  - CHAP
A1  - Brusamarello, L.
A1  - Wirth, G. I.
A1  - Camargo, V.
A1  - da Silva, M.
A1  - da Silva, R.
A1  - Glösekötter, P.
T1  - Numerical Method for Modeling Process Variations and NBTI
T2  - 16th IFIP/IEEE VLSI-SOC
Y1  - 2008
CY  - Rhodes Island, Greece
ET  - Oct. 13-15
ER  - 
TY  - CHAP
A1  - Camargo, V.
A1  - da Silva, M.
A1  - Brusamarello, L.
A1  - Wirth, G.
A1  - Glösekötter, P.
T1  - Modeling the Impact of NBTI on the Reliability of Arithmetic Circuits
T2  - Chip In The Pampa SBCCI
Y1  - 2008
ET  - September 1-4, SFORU
ER  - 
TY  - CHAP
A1  - Conrads, N.
A1  - Mertens, K.
T1  - Feldstudie zur tatsächlichen Leistung von Photovoltaikanlagen mittels Peakleistungsmessgert
T2  - Symposium Photovoltaische Solarenergie
Y1  - 2008
SN  - 978-3-934681-67-5
SP  - 323
EP  - 328
PB  - OTTI
CY  - Regensburg
ET  - 23
ER  - 
TY  - CHAP
A1  - Ebinger, Peter
A1  - Schinzel, Sebastian
A1  - Schmuckler, Martin
T1  - Security mechanisms of a legal peer-to-peer file sharing system
T2  - IADIS International Conference Applied Computing
Y1  - 2008
ER  - 
TY  - CHAP
A1  - Glösekötter, P.
A1  - Berekovic, M.
A1  - Wirth, G. I.
T1  - NBTI Degradation and Resilient Circuit Design
T2  - Workshop on Impact of Process Variability on Design and Test,  held at Design, Automation and Test in Europe Conference
Y1  - 2008
CY  - Munich
ET  - March 10-14
ER  - 
TY  - CHAP
A1  - Glösekötter, P.
A1  - Greveler, U.
A1  - Wirth, G. I.
T1  - Device Degradation and Resilient Computing
T2  - IEEE International Symposium on Circuits and Systems
Y1  - 2008
CY  - Seattle, USA
ET  - May 18-21
ER  - 
TY  - GEN
A1  - Mertens, Konrad
T1  - ,,Feldstudie zur tatsächlichen Leistung von Photovoltaikanlagen mittels Peakleistungsmessgerät",  23. Symposium "Photovoltaische Solarenergie,  Staffelstein, 6.3.08.
Y1  - 2008
ER  - 
TY  - GEN
A1  - Mertens, Konrad
T1  - "Photovoltaik - Chancen für die Kunststoffindustrie", NetzWerk-Seminar des Kunststoffland NRW e.V., Kunststoffe in der Elektrotechnik und Elektronik, Düsseldorf, 5.9.08
Y1  - 2008
ER  - 
TY  - BOOK
A1  - Salewski, F.
T1  - Empirical Evaluations of Safety-Critical Embedded Systems, PhD Thesis
Y1  - 2008
ER  - 
TY  - JOUR
A1  - Salewski, F.
A1  - Kowalewski, S.
T1  - Hardware/Software Design Considerations for Automotive Embedded Systems
JF  - IEEE Transactions on Industrial Informatics
Y1  - 2008
U6  - http://dx.doi.org/10.1109/TII.2008.2002919
VL  - 4
IS  - 3
ER  - 
TY  - CHAP
A1  - Salewski, F.
A1  - Taylor, A.
T1  - Systematic Considerations for the Application of FPGAs in Industrial Applications
T2  - Proc. Industrial Electronics 2008 (ISIE 08)
Y1  - 2008
SP  - 2009
EP  - 2015
ER  -