@incollection{GloesekoetterPachaGoseretal.2000,
  author    = {Gl{\"o}sek{\"o}tter, P. and Pacha, C. and Goser, K. F. and Wirth, G. I. and Prost, W. and Auer, U. and Agethen, M. and Tegude, F. J.},
  title     = {Digital Circuit Design Based on the Resonant-Tunneling-Hetero-Junction-Bipolar-Transistor},
  series = {SBCCI},
  booktitle = {SBCCI},
  edition   = {Sept. 18-24},
  address   = {Manaus, Brasil},
  year      = {2000},
  language  = {en}
}
@incollection{BrusamarelloWirthCamargoetal.2008,
  author    = {Brusamarello, L. and Wirth, G. I. and Camargo, V. and da Silva, M. and da Silva, R. and Gl{\"o}sek{\"o}tter, P.},
  title     = {Numerical Method for Modeling Process Variations and NBTI},
  series = {16th IFIP/IEEE VLSI-SOC},
  booktitle = {16th IFIP/IEEE VLSI-SOC},
  edition   = {Oct. 13-15},
  address   = {Rhodes Island, Greece},
  year      = {2008},
  language  = {en}
}
@incollection{CamargodaSilvaBrusamarelloetal.2008,
  author    = {Camargo, V. and da Silva, M. and Brusamarello, L. and Wirth, G. and Gl{\"o}sek{\"o}tter, P.},
  title     = {Modeling the Impact of NBTI on the Reliability of Arithmetic Circuits},
  series = {Chip In The Pampa SBCCI},
  booktitle = {Chip In The Pampa SBCCI},
  edition   = {September 1-4, SFORU},
  year      = {2008},
  language  = {en}
}
@incollection{GloesekoetterGrevelerWirth2008,
  author    = {Gl{\"o}sek{\"o}tter, P. and Greveler, U. and Wirth, G. I.},
  title     = {Device Degradation and Resilient Computing},
  series = {IEEE International Symposium on Circuits and Systems},
  booktitle = {IEEE International Symposium on Circuits and Systems},
  edition   = {May 18-21},
  address   = {Seattle, USA},
  year      = {2008},
  language  = {en}
}
@incollection{GloesekoetterBerekovicWirth2008,
  author    = {Gl{\"o}sek{\"o}tter, P. and Berekovic, M. and Wirth, G. I.},
  title     = {NBTI Degradation and Resilient Circuit Design},
  series = {Workshop on Impact of Process Variability on Design and Test, held at Design, Automation and Test in Europe Conference},
  booktitle = {Workshop on Impact of Process Variability on Design and Test, held at Design, Automation and Test in Europe Conference},
  edition   = {March 10-14},
  address   = {Munich},
  year      = {2008},
  language  = {en}
}