@incollection{JelinekJohannesLavenetal.2014, author = {Jelinek, Moriz and Johannes, G. and Laven, Mathias and Rommel, Werner and Schustereder, Hans-Joachim and Schulze, Lother and Frey, Reinhart}, title = {Deep-Level Defects in High-Dose Proton Implanted and High-Temperature Annealed Silicon}, series = {E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon XIII, ECS Transactions 64(11)}, booktitle = {E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon XIII, ECS Transactions 64(11)}, pages = {173 -- 185}, year = {2014}, language = {en} } @incollection{JelinekJohannesLavenetal.2016, author = {Jelinek, Moriz and Johannes, G. and Laven, Naveen and Ganagona, Goud and Job, Reinhart and Schustereder, Werner and Schulze, Hans-Joachim and Rommel, Matthias and Frey, Lothar}, title = {Metastable Defects in Proton Implanted and Annealed Silicon}, series = {P. Pichler (Editor): Gettering and Defect Engineering in Semiconductor Technology XVI (GADEST 2015)}, booktitle = {P. Pichler (Editor): Gettering and Defect Engineering in Semiconductor Technology XVI (GADEST 2015)}, publisher = {Trans Tech Publications Ltd.}, address = {Z{\"u}rich}, isbn = {978-3-03835-608-0}, pages = {169 -- 174}, year = {2016}, language = {en} } @incollection{JelinekJohannesLavenetal.2014, author = {Jelinek, Moriz and Johannes, G. and Laven, Reinhart and Job, Werner and Schustereder, Hans-Joachim and Schulze, Mathias and Rommel, Lothar}, title = {A New Method to Increase the Doping Efficiency of Proton Implantation in a High-Dose Regime}, series = {E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon XIII, ECS Transactions 64(11)}, booktitle = {E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon XIII, ECS Transactions 64(11)}, pages = {199 -- 208}, year = {2014}, language = {en} } @article{JobJohannesLavenetal.2012, author = {Job, Reinhart and Johannes, G. and Laven, Franz-Josef and Niedernostheide, Hans-Joachim and Schulze, Holger and Schulze, Werner}, title = {Defect Engineering for Modern Power Devices}, series = {Physica Status Solidi (a)}, volume = {209}, journal = {Physica Status Solidi (a)}, pages = {1940 -- 1949}, year = {2012}, language = {en} } @article{JohannesLavenJelineketal.2014, author = {Johannes, G. and Laven, Moriz and Jelinek, Reinhart and Job, Hans-Joachim and Schulze, Werner and Schustereder, Stefan and Kirnst{\"o}tter, Mathias and Rommel, Lothar}, title = {DLTS Characterization of Proton Implanted Silicon under Varying Annealing Conditions}, series = {Physica Status Solidi (b)}, volume = {251}, journal = {Physica Status Solidi (b)}, number = {11}, pages = {2189 -- 2192}, year = {2014}, language = {en} } @article{JohannesLavenJobetal.2013, author = {Johannes, G. and Laven, Reinhart and Job, Hans and Schulze, -Joachim and Niedernostheide, Franz-Josef and Schustereder, Werner and Frey, Lothar}, title = {Activation and Dissociation of Proton-Induced Donor Profiles in Silicon}, series = {ECS Journal of Solid State Science and Technology}, volume = {2}, journal = {ECS Journal of Solid State Science and Technology}, number = {9}, pages = {389 -- 394}, year = {2013}, language = {en} } @incollection{JohannesLavenJobetal.2012, author = {Johannes, G. and Laven, Reinhart and Job, Hans-Joachim and Schulze, Franz-Josef and Niedernostheide, Werner and Schustereder, Lothar}, title = {The Thermal Budget of Hydrogen-related Donor Profiles: Diffusion-limited Activation and Thermal Dissociation}, series = {E. Simoen, C. L. Claeys, P. Stallhofer, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon 12, ECS Transactions 50(5)}, booktitle = {E. Simoen, C. L. Claeys, P. Stallhofer, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon 12, ECS Transactions 50(5)}, pages = {161 -- 175}, year = {2012}, language = {en} } @incollection{JohannesLavenJobetal.2011, author = {Johannes, G. and Laven, Reinhart and Job, W. and Schustereder, H.-J. and Schulze, F.- J. and Niedernostheide, H. and Schulze, L.}, title = {Conversion Efficiency of Radiation Damage Profiles into Hydrogen-Related Donor Profiles}, series = {W. Jantsch, F. Sch{\"a}fer (Editors): Gettering and Defect Engineering in Semiconductor Technology XIV (GADEST 2011)}, booktitle = {W. Jantsch, F. Sch{\"a}fer (Editors): Gettering and Defect Engineering in Semiconductor Technology XIV (GADEST 2011)}, edition = {1}, publisher = {Trans Tech Publications Ltd.}, address = {Z{\"u}rich}, pages = {375 -- 384}, year = {2011}, language = {en} } @article{JohannesLavenJobetal.2011, author = {Johannes, G. and Laven, Reinhart and Job, Werner and Schustereder, Hans-Joachim and Schulze, Franz-Josef and Niedernostheide, Holger and Schulze, Lothar}, title = {Conversion Efficiency of Radiation Damage Profiles into Hydrogen-Related Donor Profiles}, series = {Solid State Phenomena}, volume = {178-179}, journal = {Solid State Phenomena}, pages = {375 -- 384}, year = {2011}, language = {en} } @incollection{KirnstoetterFaccinelliHadleyetal.2012, author = {Kirnst{\"o}tter, Stefan and Faccinelli, Martin and Hadley, Peter and Job, Reinhart and Schustereder, Werner and Johannes, G. and Laven, Hans-Joachim}, title = {Investigation of Doping Type Conversion and Diffusion Length Extraction of Proton Implanted Silicon by EBIC}, series = {E. Simoen, C. L. Claeys, P. Stallhofer, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon 12, ECS Transactions 50(5)}, booktitle = {E. Simoen, C. L. Claeys, P. Stallhofer, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon 12, ECS Transactions 50(5)}, pages = {115 -- 120}, year = {2012}, language = {en} }