@incollection{JelinekJohannesLavenetal.2014,
author = {Jelinek, Moriz and Johannes, G. and Laven, Mathias and Rommel, Werner and Schustereder, Hans-Joachim and Schulze, Lother and Frey, Reinhart},
title = {Deep-Level Defects in High-Dose Proton Implanted and High-Temperature Annealed Silicon},
series = {E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon XIII, ECS Transactions 64(11)},
booktitle = {E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon XIII, ECS Transactions 64(11)},
pages = {173 -- 185},
year = {2014},
language = {en}
}
@incollection{JelinekJohannesLavenetal.2016,
author = {Jelinek, Moriz and Johannes, G. and Laven, Naveen and Ganagona, Goud and Job, Reinhart and Schustereder, Werner and Schulze, Hans-Joachim and Rommel, Matthias and Frey, Lothar},
title = {Metastable Defects in Proton Implanted and Annealed Silicon},
series = {P. Pichler (Editor): Gettering and Defect Engineering in Semiconductor Technology XVI (GADEST 2015)},
booktitle = {P. Pichler (Editor): Gettering and Defect Engineering in Semiconductor Technology XVI (GADEST 2015)},
publisher = {Trans Tech Publications Ltd.},
address = {Z{\"u}rich},
isbn = {978-3-03835-608-0},
pages = {169 -- 174},
year = {2016},
language = {en}
}
@incollection{JelinekJohannesLavenetal.2014,
author = {Jelinek, Moriz and Johannes, G. and Laven, Reinhart and Job, Werner and Schustereder, Hans-Joachim and Schulze, Mathias and Rommel, Lothar},
title = {A New Method to Increase the Doping Efficiency of Proton Implantation in a High-Dose Regime},
series = {E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon XIII, ECS Transactions 64(11)},
booktitle = {E. Simoen, C. Claeys, O. Kakatsuka, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon XIII, ECS Transactions 64(11)},
pages = {199 -- 208},
year = {2014},
language = {en}
}
@article{JobJohannesLavenetal.2012,
author = {Job, Reinhart and Johannes, G. and Laven, Franz-Josef and Niedernostheide, Hans-Joachim and Schulze, Holger and Schulze, Werner},
title = {Defect Engineering for Modern Power Devices},
series = {Physica Status Solidi (a)},
volume = {209},
journal = {Physica Status Solidi (a)},
pages = {1940 -- 1949},
year = {2012},
language = {en}
}
@article{JohannesLavenJelineketal.2014,
author = {Johannes, G. and Laven, Moriz and Jelinek, Reinhart and Job, Hans-Joachim and Schulze, Werner and Schustereder, Stefan and Kirnst{\"o}tter, Mathias and Rommel, Lothar},
title = {DLTS Characterization of Proton Implanted Silicon under Varying Annealing Conditions},
series = {Physica Status Solidi (b)},
volume = {251},
journal = {Physica Status Solidi (b)},
number = {11},
pages = {2189 -- 2192},
year = {2014},
language = {en}
}
@article{JohannesLavenJobetal.2013,
author = {Johannes, G. and Laven, Reinhart and Job, Hans and Schulze, -Joachim and Niedernostheide, Franz-Josef and Schustereder, Werner and Frey, Lothar},
title = {Activation and Dissociation of Proton-Induced Donor Profiles in Silicon},
series = {ECS Journal of Solid State Science and Technology},
volume = {2},
journal = {ECS Journal of Solid State Science and Technology},
number = {9},
pages = {389 -- 394},
year = {2013},
language = {en}
}
@incollection{JohannesLavenJobetal.2012,
author = {Johannes, G. and Laven, Reinhart and Job, Hans-Joachim and Schulze, Franz-Josef and Niedernostheide, Werner and Schustereder, Lothar},
title = {The Thermal Budget of Hydrogen-related Donor Profiles: Diffusion-limited Activation and Thermal Dissociation},
series = {E. Simoen, C. L. Claeys, P. Stallhofer, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon 12, ECS Transactions 50(5)},
booktitle = {E. Simoen, C. L. Claeys, P. Stallhofer, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon 12, ECS Transactions 50(5)},
pages = {161 -- 175},
year = {2012},
language = {en}
}
@incollection{JohannesLavenJobetal.2011,
author = {Johannes, G. and Laven, Reinhart and Job, W. and Schustereder, H.-J. and Schulze, F.- J. and Niedernostheide, H. and Schulze, L.},
title = {Conversion Efficiency of Radiation Damage Profiles into Hydrogen-Related Donor Profiles},
series = {W. Jantsch, F. Sch{\"a}fer (Editors): Gettering and Defect Engineering in Semiconductor Technology XIV (GADEST 2011)},
booktitle = {W. Jantsch, F. Sch{\"a}fer (Editors): Gettering and Defect Engineering in Semiconductor Technology XIV (GADEST 2011)},
edition = {1},
publisher = {Trans Tech Publications Ltd.},
address = {Z{\"u}rich},
pages = {375 -- 384},
year = {2011},
language = {en}
}
@article{JohannesLavenJobetal.2011,
author = {Johannes, G. and Laven, Reinhart and Job, Werner and Schustereder, Hans-Joachim and Schulze, Franz-Josef and Niedernostheide, Holger and Schulze, Lothar},
title = {Conversion Efficiency of Radiation Damage Profiles into Hydrogen-Related Donor Profiles},
series = {Solid State Phenomena},
volume = {178-179},
journal = {Solid State Phenomena},
pages = {375 -- 384},
year = {2011},
language = {en}
}
@incollection{KirnstoetterFaccinelliHadleyetal.2012,
author = {Kirnst{\"o}tter, Stefan and Faccinelli, Martin and Hadley, Peter and Job, Reinhart and Schustereder, Werner and Johannes, G. and Laven, Hans-Joachim},
title = {Investigation of Doping Type Conversion and Diffusion Length Extraction of Proton Implanted Silicon by EBIC},
series = {E. Simoen, C. L. Claeys, P. Stallhofer, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon 12, ECS Transactions 50(5)},
booktitle = {E. Simoen, C. L. Claeys, P. Stallhofer, R. Falster, C. Mazur{\´e} (Editors): High Purity Silicon 12, ECS Transactions 50(5)},
pages = {115 -- 120},
year = {2012},
language = {en}
}