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@article{GerkeBeckerRogallaetal.2015,
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@article{HorbeltEbertUlbikaiteetal.2016,
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  number    = {7},
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@article{GerkeBeckerRogallaetal.2016,
  author    = {Gerke, Sebastian and Becker, Hans-Werner and Rogalla, Detlef and Job, Reinhart and Terheiden, Barbara},
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  year      = {2016},
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  series = {Proceedings of the 29th European Photovoltaic Solar Energy Conference and Exhibition},
  booktitle = {Proceedings of the 29th European Photovoltaic Solar Energy Conference and Exhibition},
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  year      = {2014},
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@incollection{GerkeBeckerRogallaetal.2014,
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  title     = {Investigation of Hydrogen Dependent Long-Time Thermal Characteristics of PECV-Deposited Intrinsic Amorphous Layers of Different Morphologies},
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  booktitle = {Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition},
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  year      = {2014},
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  title     = {Characterization of local Al-contacts by light beam induced current measurements and their verification by 2D simulation using flexPDE},
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  number    = {5},
  doi       = {10.1002/pssa.201532753},
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@article{GerkeHahnJobetal.2015,
  author    = {Gerke, Sebastian and Hahn, Giso and Job, Reinhart and Terheiden, Barbara},
  title     = {Bias-plasma for RF magnetron sputter deposition of passivating amorphous silicon layers},
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@article{GerkeBeckerRogallaetal.2015,
  author    = {Gerke, Sebastian and Becker, Hans-Werner and Rogalla, Detlef and Hahn, Giso and Job, Reinhart and Terheiden, Barbara},
  title     = {About Nuclear Resonant Reaction Analysis for Hydrogen Investigations in Amorphous Silicon Layers},
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@article{HorbeltGisoJobetal.2015,
  author    = {Horbelt, Renate and Giso, Hahn and Job, Reinhart and Terheiden, Barbara},
  title     = {Void formation in PERC solar cells and their impact on the electrical cell parameters verified by luminescence and scanning acoustic microscope measurements},
  series = {Energy Proceedia},
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  doi       = {10.1016/j.egypro.2015.12.294},
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  year      = {2015},
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@article{GerkeMicardJobetal.2016,
  author    = {Gerke, Sebastian and Micard, Gabriel and Job, Reinhart and Hahn, Giso and Terheiden, Barbara},
  title     = {Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films},
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  journal   = {Physica Status Solidi (c)},
  doi       = {10.1002/pssc.201600019},
  pages     = {1 -- 5},
  year      = {2016},
  language  = {en}
}