@misc{Gloesekoetter2007,
  author    = {Gl{\"o}sek{\"o}tter, P.},
  title     = {Information processing Technologies: From Transistors to Molecular and Quantum Devices, EMicro 2007, May 5 - 9, UFRGS, Porto Alegre, RS, Brazil},
  year      = {2007},
  language  = {en}
}
@incollection{EstevezRebelGonzalezetal.2013,
  author    = {Estevez, F. and Rebel, G. and Gonz{\´a}lez, J. and Palomares, J. M. and Gl{\"o}sek{\"o}tter, P.},
  title     = {Body energy harvesting for WSN. State of art and examples},
  series = {Jornadas de Computaci{\´o}n Empotrada de Espana (JCE)},
  booktitle = {Jornadas de Computaci{\´o}n Empotrada de Espana (JCE)},
  edition   = {09/2013},
  year      = {2013},
  language  = {en}
}
@incollection{PachaGloesekoetterGoser1998,
  author    = {Pacha, C. and Gl{\"o}sek{\"o}tter, P. and Goser, K. F.},
  title     = {Adiabatic Switching and Power Dissipation of Dynamic Resonant Tunneling Device Logic Circuits},
  series = {3rd Workshop on Innovative Circuits and Systems for Nano Elektronics, Nano-EL98},
  booktitle = {3rd Workshop on Innovative Circuits and Systems for Nano Elektronics, Nano-EL98},
  edition   = {Sept. 5-6},
  publisher = {Munich Paper C2/1-6},
  year      = {1998},
  language  = {en}
}
@incollection{GloesekoetterKansteinJungetal.1998,
  author    = {Gl{\"o}sek{\"o}tter, P. and Kanstein, A. and Jung, S. and Goser, K. F.},
  title     = {Implementation of a RBF Network Based on Possibilistic Reasoning, ISSN 1089-6503},
  series = {Proceedings of the 24th EUROMICRO conference},
  booktitle = {Proceedings of the 24th EUROMICRO conference},
  edition   = {August 25-27},
  address   = {V{\"a}steras, Sweden},
  isbn      = {0-8186-8646-4},
  pages     = {677 -- 682},
  year      = {1998},
  language  = {en}
}
@incollection{RojasAnguitaPelayoetal.1997,
  author    = {Rojas, I. and Anguita, M. and Pelayo, F. J. and Gl{\"o}sek{\"o}tter, P. and Prieto, A.},
  title     = {CMOS implementation of RBF Neural Networks using Adaptive Baussian Radial Functions},
  series = {Proceedings of the 6th International Conference on Microelectronics for Neural Networks, Evolutionary \& Fuzzy Systems (MicroNeuro'97)},
  booktitle = {Proceedings of the 6th International Conference on Microelectronics for Neural Networks, Evolutionary \& Fuzzy Systems (MicroNeuro'97)},
  edition   = {September},
  address   = {Dresden, Germany},
  year      = {1997},
  language  = {en}
}
@misc{Gloesekoetter2007,
  author    = {Gl{\"o}sek{\"o}tter, P.},
  title     = {On the Way to Nanoelectronics, Institute of Computer Engineering, University L{\"u}beck, Germany, April 27},
  year      = {2007},
  language  = {en}
}
@misc{Gloesekoetter2005,
  author    = {Gl{\"o}sek{\"o}tter, P.},
  title     = {Silicon nanoelectronics and mobile broadband wireless technologies, Departamento de Arquitectura Tecnologa de Computadores, Universidad de Granada, Spain, March},
  year      = {2005},
  language  = {en}
}
@incollection{GoserGloesekoetterDienstuhl2004,
  author    = {Goser, K. and Gl{\"o}sek{\"o}tter, P. and Dienstuhl, J.},
  title     = {Nanoelectronics and Nanosystems - From Transistors to Molecular and Quantum Devices},
  publisher = {Springer},
  address   = {Berlin, Heidelberg, New York},
  isbn      = {3-540-40443-0},
  year      = {2004},
  language  = {en}
}
@incollection{GloesekoetterGrevelerWirth2008,
  author    = {Gl{\"o}sek{\"o}tter, P. and Greveler, U. and Wirth, G. I.},
  title     = {Device Degradation and Resilient Computing},
  series = {IEEE International Symposium on Circuits and Systems},
  booktitle = {IEEE International Symposium on Circuits and Systems},
  edition   = {May 18-21},
  address   = {Seattle, USA},
  year      = {2008},
  language  = {en}
}
@incollection{GloesekoetterBerekovicWirth2008,
  author    = {Gl{\"o}sek{\"o}tter, P. and Berekovic, M. and Wirth, G. I.},
  title     = {NBTI Degradation and Resilient Circuit Design},
  series = {Workshop on Impact of Process Variability on Design and Test, held at Design, Automation and Test in Europe Conference},
  booktitle = {Workshop on Impact of Process Variability on Design and Test, held at Design, Automation and Test in Europe Conference},
  edition   = {March 10-14},
  address   = {Munich},
  year      = {2008},
  language  = {en}
}