TY  - GEN
A1  - Jansing, C.
A1  - Wahab, H.
A1  - Tesch, M. F.
A1  - Gilbert, M.
A1  - Gaupp, A.
A1  - Mertins, H.-Ch.
A1  - Sokolov, A.
A1  - Shin, Dong Hee
A1  - Choi, Suk-Ho
A1  - Timmers, H.
A1  - Legut, D.
A1  - Oppeneer, P. M.
T1  - Thickness, roughness and electronic structure characterisation of graphene using soft x-ray reflection spectroscopy DPG Meeting Berlin, O 33.9
Y1  - 2015
UR  - https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/7277
ER  -