@misc{JansingWahabTeschetal.2015,
  author    = {C. Jansing and H. Wahab and M. F. Tesch and M. Gilbert and A. Gaupp and H.-Ch. Mertins and A. Sokolov and Dong Hee Shin and Suk-Ho Choi and H. Timmers and D. Legut and P. M. Oppeneer},
  title     = {Thickness, roughness and electronic structure characterisation of graphene using soft x-ray reflection spectroscopy DPG Meeting Berlin, O 33.9},
  institution = {Physikingenieurwesen (PHY)},
  type      = {lecture},
  year        = {2015},
}