TY  - JOUR
A1  - Gerke, Sebastian
A1  - Micard, Gabriel
A1  - Job, Reinhart
A1  - Hahn, Giso
A1  - Terheiden, Barbara
T1  - Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
T2  - Physica Status Solidi (c)
Y1  - 2016
UR  - https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/7934
SP  - 1
EP  - 5
ER  -