TY  - JOUR
A1  - Armoush, A.
A1  - Salewski, F.
A1  - Kowalewski, S.
T1  - Design Pattern Representation for Safety-Critical Embedded Systems
T2  - Journal of Software Engineering and Applications (JSEA)
Y1  - 2009
UR  - https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/5984
VL  - 2
IS  - 1
SP  - 1
EP  - 12
ER  -