TY  - CHAP
A1  - Armoush, A.
A1  - Salewski, F.
A1  - Kowalewski, S.
T1  - Effective Pattern Representation for Safety Critical Embedded Systems
T2  - Proc. 2008 International Conference on Computer Science and Software Engineering,  vol. 4
Y1  - 2008
UR  - https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/5982
SP  - 91
EP  - 97
PB  - IEEE CS
ER  -