TY  - GEN
A1  - Job, Reinhart
T1  - Defect Engineering and Analysis of Light-Ion Implanted Float-Zone Silicon, Seminar, 4.9.2012, Engineering School, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brasilien
Y1  - 2012
UR  - https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/4703
ER  -